Overview  

AME-ST2258C multi-function digital four probe tester is a multi-purpose comprehensive measuring instrument that uses the four probe measurement principle to test resistivity/square resistance. The instrument is designed in accordance with GB/T 1551-2009 Method for Measuring Resistivity of Silicon Single Crystals, GB/T 1551-1995 DC Two Probe Method for Measuring Resistivity of Silicon and Germanium Single Crystals, and GB/T 1552-1995 DC Four Probe Method for Measuring Resistivity of Silicon and Germanium Single Crystals, with reference to American A.S.T.M standards.

The instrument is composed of a host, an optional four probe probe, a test bench, etc.

The host is mainly composed of a precision constant current source, a high-resolution ADC, and an embedded microcontroller system. All parameter settings and function conversion of the instrument are input by digital keyboard; It has zero position and full degree self calibration functions; Full automatic range switching of voltage and current; The test result is directly displayed by the digital meter. This tester is specially equipped with the function of classifying test results, with a maximum classification of 10 categories.

Probe selection: according to the requirements of different material characteristics, there are many types of probes available. It has a high wear-resistant tungsten carbide probe probe to test the resistivity/square resistance of hard materials such as silicon semiconductors, metals and conductive plastics; There is also a spherical gold-plated copper alloy probe probe, which can measure the resistivity/square resistance of semiconductor materials such as conductive films of flexible materials, metal coatings or films, conductive films (ITO films) or nano coatings on substrates such as ceramics or glass. With the four terminal test fixture, the resistance of the resistor body, the low and median resistance of the metal conductor and the contact resistance of the switch can also be measured. With a special probe, it can also test the resistivity of the coating on the foil such as the battery pole piece.

Selection of test bench: SZT-C or SZT-F test bench is generally selected for four probe test method. SZT-K test bench is selected for resistivity test by two probe method, or SZT-D test bench can be selected to test the resistivity of semiconductor powder, or SZT-G test bench can be selected to test the resistivity of rubber and plastic materials.

The instrument has the characteristics of high measurement accuracy, high sensitivity, good stability, high intelligence, compact structure and easy use.

Basic Technical Parameters      

1. Measurement range and resolution (in parentheses, it can be expanded downward by one order of magnitude)

Resistance: 10.0 × 10^-6 ～ 200.0 × 10³ Ω,   resolution 1.0 × 10^-6 ～ 0.1 × 10³ Ω

（1.0 × 10^-6 ～ 20.00 × 10³ Ω,   resolution 0.1 × 10^-6 ～ 0.01 × 10³ Ω）

Resistivity: 10.0 × 10^-6 ～ 200.0 × 10³ Ω – cm   resolution 1.0 × 10^-6 ～ 0.1 × 10³ Ω-cm

（1.0 × 10^-6 ～ 20.00 × 10³ Ω – cm   resolution 0.1 × 10^-6 ～ 0.01 × 10³ Ω-cm）

Block resistance: 50.0 × 10^-6 ～ 1.0 × 10⁶ Ω/□   Resolution 5.0 × 10^-6 ～ 0.5 × 10³ Ω/□

（5.0 × 10^-6 ～ 100.0 × 10³ Ω/□   Resolution 0.5 × 10^-6 ～ 0.1 × 10³ Ω/□）

2. Material size (determined by the optional test bench and test method)

Diameter:  Φ 15～180mm，180mm × 180mm, unlimited handheld mode

Length (height): direct test mode of test bench H ≤ 160mm, handheld mode is not limited

Measuring orientation: both axial and radial

3. Range division and error level

Full scale display	200.0	20.00	2.000	200.0	20.00	2.000	200.0	20.00	2.000
Conventional range	kΩ/cm	kΩ/cm		Ω/cm			mΩ/cm		—
Maximum extended range	—	kΩ/cm		Ω/cm			mΩ/cm		mΩ/cm
basic error	±2%FSB±4LSB	±1.5%FSB±4LSB	±0.5%FSB±2LSB				±0.5%FSB±4LSB		±1.0%FSB±4LSB

4. Working power supply: 220V(110V) ± 10%, f=50Hz(60Hz) ± 4%, PW ≤ 5W

5. Boundary dimension: 245mm (length) × 220 mm wide × 95mm high

Net weight: ≤ 1.5 ～ 2.0kg